ISO 17862:2013

Retirada (Edición 1, 2013)

Nueva versión disponible: ISO 17862:2022

Resumen

ISO 17862:2014 specifies a method for determining the maximum count rate for an acceptable limit of divergence from linearity of the intensity scale in single ion counting time-of-flight (TOF) secondary ion mass spectrometers using a test based on isotopic ratios in spectra from poly(tetrafluoroethylene) (PTFE). It also includes a method to correct for intensity nonlinearity arising from intensity lost from a microchannel plate (MCP) or scintillator and photomultiplier followed by a time-to-digital converter (TDC) detection system caused by secondary ions arriving during its dead-time. The correction can increase the intensity range for 95 % linearity by a factor of up to more than 50 so that a higher maximum count rate can be employed for those spectrometers for which the relevant correction formulae have been shown to be valid. ISO 17862:2014 can also be used to confirm the validity of instruments in which the dead-time correction is already made but in which further increases can or cannot be possible.

Informaciones generales

Estado
: Retirada

Fecha de publicación
: 2013-12

Etapa
: Retirada de la Norma Internacional [95.99]
Edición
: 1

Número de páginas
: 25
Comité Técnico :
ISO/TC 201/SC 6

ICS :
71.040.40
RSS actualizaciones