Resumen
This document is intended to aid the operators of X-ray photoelectron spectrometers in their analysis of typical samples. It takes the operator through the analysis from the handling of the sample and the calibration and setting-up of the spectrometer to the acquisition of wide and narrow scans and also gives advice on quantification and on preparation of the final report.
Informaciones generales
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Estado: PublicadoFecha de publicación: 2019-08Etapa: Norma Internacional en proceso de revisión sistemática [90.20]
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Edición: 2Número de páginas: 32
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Comité Técnico :ISO/TC 201/SC 7ICS :71.040.40
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Ciclo de vida
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Anteriormente
RetiradaISO 10810:2010
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Ahora
