Filter :
| Standard and/or project under the direct responsibility of ISO/TC 202/SC 3 Secretariat | Stage | ICS |
|---|---|---|
|
Microbeam analysis — Analytical electron microscopy — The measurement of the dislocation density in thin metals
|
20.60 |
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Microbeam analysis — Analytical electron microscopy — Guidelines of specimen preparation for transmission electron microscope using focused ion beam processing
|
30.20 |
|
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Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
|
95.99 | |
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Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
|
60.60 | |
|
Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials
|
95.99 | |
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Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials
|
60.60 | |
|
Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysis
|
60.60 | |
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Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
|
60.60 | |
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Microbeam analysis — Analytical electron microscopy — Procedures for determining the point resolution of high-resolution transmission electron microscope
|
20.60 |
|
|
Microbeam analysis — Analytical electron microscopy — Selected-area electron diffraction analysis using a transmission electron microscope
|
95.99 | |
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Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
|
90.92 | |
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Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
|
50.00 | |
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Microbeam analysis — Analytical transmission electron microscopy — Methods for calibrating image magnification by using reference materials having periodic structures
|
95.99 | |
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Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures
|
95.99 | |
|
Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures
|
60.60 |
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