ISO 14975:2000 - Surface chemical analysis — Information formats

Published (Edition 1, 2000)

This publication was last reviewed and confirmed in 2022. Therefore this version remains current.

ISO 14975:2000

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Abstract

This International Standard specifies a format to supplement ISO 14976 to transfer data for the creation, expansion

and revision of a surface chemical analysis spectral database. The format is applied to Auger electron

spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS) spectral data.

General information

Status
: Published

Publication date
: 2000-12

Stage
: International Standard confirmed [90.93]
Edition
: 1

Number of pages
: 17
Technical Committee :
ISO/TC 201/SC 3

ICS :
35.240.70 71.040.40
RSS updates

Life cycle

Now

Published

ISO 14975:2000

A standard is reviewed every 5 years
Stage: 90.93 (Confirmed)

This standard contributes to the following Sustainable Development Goal

Industry, Innovation and Infrastructure

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