Abstract
ISO 11952:2014 specifies methods for characterizing and calibrating the scan axes of scanning-probe microscopes for measuring geometric quantities at the highest level. It is applicable to those providing further calibrations and is not intended for general industry use, where a lower level of calibration might be required.
General information
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Status: WithdrawnPublication date: 2014-05Stage: Withdrawal of International Standard [95.99]
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Edition: 1Number of pages: 58
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Technical Committee :ISO/TC 201/SC 9ICS :71.040.40
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Life cycle
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Now
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Revised by
PublishedISO 11952:2019