International Standard
ISO 15625:2014
Silk — Electronic test method for defects and evenness of raw silk
Reference number
ISO 15625:2014
ISO 15625:2014
Edition 1
2014-05
2014-05
© ISO 2024
International Standard
p
ISO 15625:2014
55447
Published
(Edition 1, 2014)
This standard was last reviewed and confirmed in 2023.
Therefore this version remains current.
Abstract
ISO 15625:2014 specifies a test method for defects and evenness of raw silk by capacitive and optical electronic testers.
It is applicable to raw silk with the yarn size between 13,3 dtex and 76,7 dtex or 12 denier and 69 denier, whether in skein or on cone, soaked or unsoaked.
General information
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Status: PublishedPublication date: 2014-05Stage: International Standard confirmed [90.93]
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Edition: 1Number of pages: 15
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Technical Committee :ISO/TC 38/SC 23ICS :59.080.01
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