ISO 18554:2016

Published (Edition 1, 2016)

This publication was last reviewed and confirmed in 2021. Therefore this version remains current.

ISO 18554:2016

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Abstract

ISO 18554:2016 provides a simple procedure for identifying, estimating and correcting for unintended degradation in the elemental composition or chemical state of a material which occurs as a result of X-radiation during the time that a specimen material is exposed to the X-rays used in X-ray photoelectron spectroscopy (XPS).

ISO 18554:2016 does not address comparisons between different types of material nor does it address the mechanisms, depth, or chemical nature of the degradation that occurs. The correction procedure proposed is only valid if the changes are caused by the X-rays and result in less than a 30 % reduction or increase in intensity of a chosen photoelectron peak from the sample material.

General information

Status
: Published

Publication date
: 2016-03

Stage
: International Standard confirmed [90.93]
Edition
: 1

Number of pages
: 17
Technical Committee :
ISO/TC 201/SC 7

ICS :
71.040.40
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