International Standard
ISO 17297:2025
Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary
Reference number
ISO 17297:2025
Edition 1
2025-05
Read sample
ISO 17297:2025
84897
Published (Edition 1, 2025)

ISO 17297:2025

ISO 17297:2025
84897
Language
Format
CHF 98
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Abstract

This document defines the most commonly used terms for transmission electron microscopy (TEM) specimen preparation using focused ion beam (FIB).

General information

  •  : Published
     : 2025-05
    : International Standard published [60.60]
  •  : 1
     : 14
  • ISO/TC 202/SC 1
  • RSS updates

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