Abstract
ISO 19606:2017 describes a method to evaluate the adequateness of a probe tip for fine-ceramic thin-film surface roughness measurements by atomic force microscopy, of surfaces with an arithmetical mean roughness, Ra, in the range of about 1 nm to 30 nm and a mean width of roughness profile elements, RSm, in the range of about 0,04 μm to 2,5 μm.
General information
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Status: Under developmentPublication date: 2024-11Stage: International Standard under publication [60.00]
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Edition: 2
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Technical Committee :ISO/TC 206ICS :81.060.30
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Life cycle
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Previously
PublishedISO 19606:2017
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Now