Resumen
ISO 11505:2013 describes a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer films.
It is limited to a description of general procedures of quantification of GD-OES and is not applicable directly for the quantification of individual materials having various thicknesses and elements to be determined.
Informaciones generales
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Estado: En desarrolloEtapa: Borrador de comité (CD) registrado [30.00]
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Edición: 2
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Comité Técnico :ISO/TC 201/SC 8
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Ciclo de vida
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Anteriormente
PublicadoISO 11505:2012
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Ahora
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