Reference number
ISO 11505:2012
ISO 11505:2012
© ISO 2024
International Standard
ISO 11505:2012
Surface chemical analysis — General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
Edition 1
2012-12
2012-12
ISO 11505:2012
50563
Published
(Edition 1, 2012)
This publication was last reviewed and confirmed in 2018.
Therefore this version remains current.
Expected to be replaced by ISO/DIS 11505 within the coming months.
Abstract
ISO 11505:2013 describes a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer films.
It is limited to a description of general procedures of quantification of GD-OES and is not applicable directly for the quantification of individual materials having various thicknesses and elements to be determined.
General information
-
Status: PublishedPublication date: 2012-12Stage: International Standard to be revised [90.92]
-
Edition: 1Number of pages: 33
-
Technical Committee :ISO/TC 201/SC 8ICS :71.040.40
- RSS updates
Next version under development
Draft
International StandardISO/DIS 11505
Surface chemical analysis — General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
Reference number
ISO/DIS 11505
ISO/DIS 11505
Edition 1
© ISO 2024
Draft International Standard
ISO/DIS 11505
Surface chemical analysis — General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
Life cycle
-
Now
-
Will be replaced by
Under developmentISO/DIS 11505
