ISO 17470:2014
p
ISO 17470:2014
64783

Abstract

 Preview

ISO 17470:2014 gives guidance for the identification of elements and the investigation of the presence of specific elements within a specific volume (on a μm3 scale) contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.


General information 

  •  :  Published
     : 2014-01
  •  : 2
     : 10
  •  : ISO/TC 202/SC 2 Electron probe microanalysis
  •  :
    71.040.99 Other standards related to analytical chemistry

Buy this standard

en
Format Language
std 1 58 PDF + ePub
std 2 58 Paper
  • CHF58

Got a question?

Check out our FAQs

Customer care
+41 22 749 08 88

Opening hours:
Monday to Friday - 09:00-12:00, 14:00-17:00 (UTC+1)

Keep up to date with ISO

Sign up to our newsletter for the latest news, views and product information.