Reference number
ISO 23729:2022
International Standard
ISO 23729:2022
Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
Edition 1
2022-07
Preview
ISO 23729:2022
79844
Indisponible en français
Publiée (Edition 1, 2022)

ISO 23729:2022

ISO 23729:2022
79844
Langue
Format
CHF 96
Convertir les francs suisses (CHF) dans une autre devise

Résumé

This document describes a procedure for the quantitative characterization of the probe tip of an atomic force microscope (AFM) probe and a restoration of AFM topography images dilated by finite probe size. The three-dimensional shape of the probe apex is extracted by image reconstruction using suitable reference materials. This document is applicable to the reconstruction of AFM topography images of solid material surfaces.

Informations générales

  •  : Publiée
     : 2022-07
    : Norme internationale publiée [60.60]
  •  : 1
  • ISO/TC 201/SC 9
    71.040.40 
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