ISO/PRF 11505

This draft is in the approval phase.

Will replace ISO 11505:2012

Abstract

ISO 11505:2013 describes a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer films.

It is limited to a description of general procedures of quantification of GD-OES and is not applicable directly for the quantification of individual materials having various thicknesses and elements to be determined.

General information

Status
: Under development

Stage
: Final text received or FDIS registered for formal approval [50.00]
Edition
: 2
Technical Committee :
ISO/TC 201/SC 8

ICS :
71.040.40
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