ISO/DIS 11505

This Draft International Standard is in the enquiry phase with ISO members.

Will replace ISO 11505:2012

ISO/DIS 11505

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Abstract

ISO 11505:2013 describes a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer films.

It is limited to a description of general procedures of quantification of GD-OES and is not applicable directly for the quantification of individual materials having various thicknesses and elements to be determined.

General information

Status
: Under development

You can help develop this draft international standard by contacting your national member

Stage
: DIS ballot initiated: 12 weeks [40.20]
Edition
: 2

Number of pages
: 34
Technical Committee :
ISO/TC 201/SC 8

ICS :
71.040.40
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